Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Machine learning based defect examination for semiconductor specimens

Machine learning based defect examination for semiconductor specimens

US Patent 12423800 · Granted Sep 23, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Defect examination on a semiconductor specimen2025
Defect examination on a semiconductor specimen2025
Defect examination on a semiconductor specimen2025
Monitoring system and method for verifying measurements in patterned structures2024
Machine learning-based defect detection of a specimen2022
Apparatus and methods for thickness and velocity measurement of flat moving mate2022
Monitoring system and method for verifying measurements in patterned structures2019
Apparatus and method for defect detection including patch-to-patch comparisons2016
Acoustic method and device for distance measurement2004