Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423800 | Machine learning based defect examination for semiconductor specimens | Yehonatan Hai Ofir, Yotam Nissim Ben Shoshan, Boris Sherman | 2025-09-23 |
| 12400319 | Defect examination on a semiconductor specimen | Yehonatan Hai Ofir, Yehonatan Ridelman, Boris Sherman, Boaz Cohen | 2025-08-26 |
| 11449711 | Machine learning-based defect detection of a specimen | Ran Schleyen, Boaz Cohen, Irad Peleg, Denis Suhanov, Ore SHTALRID | 2022-09-20 |