Issued Patents All Time
Showing 25 most recent of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400319 | Defect examination on a semiconductor specimen | Yehonatan Hai Ofir, Yehonatan Ridelman, Ran BADANES, Boris Sherman | 2025-08-26 |
| 12361531 | Machine learning-based classification of defects in a semiconductor specimen | Ohad Shaubi, Kirill Savchenko, Ore SHTALRID | 2025-07-15 |
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2024-12-31 |
| 11983867 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Ori Petel +2 more | 2024-05-14 |
| 11940390 | Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest | Yotam Sofer, Shaul Engler, Saar Shabtay, Amir Bar, Marcelo BACHER | 2024-03-26 |
| 11790515 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Ran Schleyen | 2023-10-17 |
| 11756188 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Evgeny Bal, Ariel Shkalim | 2023-09-12 |
| 11568531 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Ohad Shaubi, Denis Suhanov, Assaf Asbag | 2023-01-31 |
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Ran Schleyen, Irad Peleg, Denis Suhanov, Ore SHTALRID | 2022-09-20 |
| 11423529 | Determination of defect location for examination of a specimen | Doron Girmonsky, Rafael Ben Ami, Dror Shemesh | 2022-08-23 |
| 11379972 | Detecting defects in semiconductor specimens using weak labeling | Irad Peleg, Ran Schleyen | 2022-07-05 |
| 11360030 | Selecting a coreset of potential defects for estimating expected defects of interest | Yotam Sofer, Shaul Engler, Saar Shabtay, Amir Bar, Marcelo BACHER | 2022-06-14 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2022-05-31 |
| 11348224 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Ori Petel +2 more | 2022-05-31 |
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Assaf Asbag, Shiran Gan-Or | 2022-05-03 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Ariel Shkalim, Evgeny Bal | 2022-03-15 |
| 11263741 | System and methods of generating comparable regions of a lithographic mask | Gadi Greenberg, Sivan Lifschitz, Shay Attal, Oded O. Dassa, Ziv Parizat | 2022-03-01 |
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11199506 | Generating a training set usable for examination of a semiconductor specimen | Ohad Shaubi, Assaf Asbag | 2021-12-14 |
| 11151710 | Automatic selection of algorithmic modules for examination of a specimen | Ran Schleyen, Eyal Zakkay | 2021-10-19 |
| 11151706 | Method of classifying defects in a semiconductor specimen and system thereof | Kirill Savchenko, Assaf Asbag | 2021-10-19 |
| 11138507 | System, method and computer program product for classifying a multiplicity of items | Assaf Asbag | 2021-10-05 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Zeev Zohar | 2021-06-15 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |
| 10921334 | System, method and computer program product for classifying defects | Kirill Savchenko, Assaf Asbag | 2021-02-16 |