Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131458 | Determination of a simulated image of a specimen | — | 2024-10-29 |
| 11790515 | Detecting defects in semiconductor specimens using weak labeling | Ran Schleyen, Boaz Cohen | 2023-10-17 |
| 11562476 | Determination of a simulated image of a specimen | — | 2023-01-24 |
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Ran Schleyen, Boaz Cohen, Denis Suhanov, Ore SHTALRID | 2022-09-20 |
| 11379972 | Detecting defects in semiconductor specimens using weak labeling | Ran Schleyen, Boaz Cohen | 2022-07-05 |