Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11568531 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Ohad Shaubi, Assaf Asbag, Boaz Cohen | 2023-01-31 |
| 11449711 | Machine learning-based defect detection of a specimen | Ran BADANES, Ran Schleyen, Boaz Cohen, Irad Peleg, Ore SHTALRID | 2022-09-20 |