Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11568531 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Ohad Shaubi, Denis Suhanov, Boaz Cohen | 2023-01-31 |
| 11526979 | Method of defect classification and system thereof | Orly ZVITIA, Idan Kaizerman, Efrat Rosenman | 2022-12-13 |
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Boaz Cohen, Shiran Gan-Or | 2022-05-03 |
| 11199506 | Generating a training set usable for examination of a semiconductor specimen | Ohad Shaubi, Boaz Cohen | 2021-12-14 |
| 11151706 | Method of classifying defects in a semiconductor specimen and system thereof | Kirill Savchenko, Boaz Cohen | 2021-10-19 |
| 11138507 | System, method and computer program product for classifying a multiplicity of items | Boaz Cohen | 2021-10-05 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen, Zeev Zohar | 2021-06-15 |
| 10921334 | System, method and computer program product for classifying defects | Kirill Savchenko, Boaz Cohen | 2021-02-16 |
| 10832092 | Method of generating a training set usable for examination of a semiconductor specimen and system thereof | Ohad Shaubi, Boaz Cohen | 2020-11-10 |
| 10803575 | System, method and computer program product for generating a training set for a classifier | Ohad Shaubi, Idan Kaizerman | 2020-10-13 |
| 10748271 | Method of defect classification and system thereof | Orly ZVITIA, Idan Kaizerman, Efrat Rosenman | 2020-08-18 |
| 10360669 | System, method and computer program product for generating a training set for a classifier | Ohad Shaubi, Idan Kaizerman | 2019-07-23 |