| 11568531 |
Method of deep learning-based examination of a semiconductor specimen and system thereof |
Ohad Shaubi, Denis Suhanov, Boaz Cohen |
2023-01-31 |
| 11526979 |
Method of defect classification and system thereof |
Orly ZVITIA, Idan Kaizerman, Efrat Rosenman |
2022-12-13 |
| 11321633 |
Method of classifying defects in a specimen semiconductor examination and system thereof |
Boaz Cohen, Shiran Gan-Or |
2022-05-03 |
| 11199506 |
Generating a training set usable for examination of a semiconductor specimen |
Ohad Shaubi, Boaz Cohen |
2021-12-14 |
| 11151706 |
Method of classifying defects in a semiconductor specimen and system thereof |
Kirill Savchenko, Boaz Cohen |
2021-10-19 |
| 11138507 |
System, method and computer program product for classifying a multiplicity of items |
Boaz Cohen |
2021-10-05 |
| 11037286 |
Method of classifying defects in a semiconductor specimen and system thereof |
Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen, Zeev Zohar |
2021-06-15 |
| 10921334 |
System, method and computer program product for classifying defects |
Kirill Savchenko, Boaz Cohen |
2021-02-16 |
| 10832092 |
Method of generating a training set usable for examination of a semiconductor specimen and system thereof |
Ohad Shaubi, Boaz Cohen |
2020-11-10 |
| 10803575 |
System, method and computer program product for generating a training set for a classifier |
Ohad Shaubi, Idan Kaizerman |
2020-10-13 |
| 10748271 |
Method of defect classification and system thereof |
Orly ZVITIA, Idan Kaizerman, Efrat Rosenman |
2020-08-18 |
| 10360669 |
System, method and computer program product for generating a training set for a classifier |
Ohad Shaubi, Idan Kaizerman |
2019-07-23 |
