Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11321633 | Method of classifying defects in a specimen semiconductor examination and system thereof | Assaf Asbag, Boaz Cohen | 2022-05-03 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Boaz Cohen, Zeev Zohar | 2021-06-15 |