Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Amit Batikoff, Daniel Ravid +1 more | 2024-12-31 |
| 11526979 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Idan Kaizerman | 2022-12-13 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Amit Batikoff, Daniel Ravid +1 more | 2022-05-31 |
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |
| 10748271 | Method of defect classification and system thereof | Assaf Asbag, Orly ZVITIA, Idan Kaizerman | 2020-08-18 |
| 7990546 | High throughput across-wafer-variation mapping | Jeong-Ho Yeo, Erez Ravid, Doron Meshulach, Gadi Greenberg, Kobi Kan +2 more | 2011-08-02 |