Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183066 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2024-12-31 |
| 11348001 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2022-05-31 |
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2021-12-21 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff +1 more | 2021-05-18 |
| 9715724 | Registration of CAD data with SEM images | Ishai Schwarzband, Yan Ivanchenko, Orly ZVITIA, Idan Kaizerman | 2017-07-25 |