Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11756188 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Boaz Cohen, Evgeny Bal, Ariel Shkalim | 2023-09-12 |
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Grigory Klebanov, Shimon Levi +6 more | 2023-05-16 |
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Yan Avniel, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Boaz Cohen, Ariel Shkalim, Evgeny Bal | 2022-03-15 |
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Yan Avniel, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
| 10731979 | Method for monitoring nanometric structures | Shimon Levi, Roman Kris | 2020-08-04 |
| 10636140 | Technique for inspecting semiconductor wafers | Sergey Khristo, Yan Avniel | 2020-04-28 |
| 10504693 | Evaluating an object | Shay Attal, Shaul Cohen, Guy Maoz, Noam Zac, Mor Baram +4 more | 2019-12-10 |
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2019-07-16 |
| 10103005 | Imaging low electron yield regions with a charged beam imager | Yuval Gronau, Barak Dee-Noor | 2018-10-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2018-03-13 |
| 9858658 | Defect classification using CAD-based context attributes | Idan Kaizerman, Efrat Rozenman | 2018-01-02 |
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Yan Ivanchenko, Dan Lange, Arbel Englander +3 more | 2017-11-21 |
| 9715724 | Registration of CAD data with SEM images | Yan Ivanchenko, Daniel Ravid, Orly ZVITIA, Idan Kaizerman | 2017-07-25 |
| 9674536 | Technique for visualizing elements in images by color coding | Yakov Weinberg, Hagai Kirshner | 2017-06-06 |
| 9595091 | Defect classification using topographical attributes | Idan Kaizerman, Efrat Rozenman | 2017-03-14 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2016-12-27 |
| 9490101 | System and method for scanning an object | Yuval Gronau, Benzion Sender, Dror Shemesh, Ran Schleyen, Ofir Greenberg | 2016-11-08 |
| 9378923 | Three-dimensional mapping using scanning electron microscope images | Yakov Weinberg | 2016-06-28 |
| 8946627 | Three-dimensional mapping using scanning electron microscope images | Yakov Weinberg | 2015-02-03 |
| 8604427 | Three-dimensional mapping using scanning electron microscope images | Yakov Weinberg | 2013-12-10 |
| 8213024 | Method and system for aerial imaging of a reticle | Shmuel Mangan, Boris Goldberg, On Haran, Michael Ben-Yishay, Amir Sagiv +1 more | 2012-07-03 |
| 8098926 | Method and system for evaluating an evaluated pattern of a mask | Shmoolik Mangan, Chaim Braude, Michael Ben-Yishai, Gadi Greenberg | 2012-01-17 |
| 7310796 | System and method for simulating an aerial image | — | 2007-12-18 |