Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Rafael BISTRITZER, Vadim Vereschagin, Elad Sommer +5 more | 2023-06-27 |
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Ishai Schwarzband, Grigory Klebanov, Shimon Levi +6 more | 2023-05-16 |
| 11455715 | Epitaxy metrology in fin field effect transistors | Jitendra Pradipkumar Chaudhary, Roman Kris, Ran Alkoken, Chih-Chieh Chang, Einat Frishman | 2022-09-27 |