RM

Roi Meir

Applied Materials: 1 patents #4,780 of 7,310Top 70%
Overall (All Time): #2,583,788 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11651509 Method, system and computer program product for 3D-NAND CDSEM metrology Roman Kris, Sahar LEVIN, Ishai Schwarzband, Grigory Klebanov, Shimon Levi +6 more 2023-05-16