Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347734 | Examination of a hole formed in a semiconductor specimen | Rafael BISTRITZER, Vadim Vereschagin, Roman Kris, Ilan BEN-HARUSH, Omer Kerem +2 more | 2025-07-01 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Rafael BISTRITZER, Vadim Vereschagin, Elad Sommer +5 more | 2023-06-27 |
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Ishai Schwarzband, Shimon Levi +6 more | 2023-05-16 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Einat Frishman, Tal Orenstein, Meir Vengrover, Noa Marom +3 more | 2022-09-13 |
| 11056404 | Evaluating a hole formed in an intermediate product | Roman Kris, Dhananjay Singh Rathore, Einat Frishman, Sharon Duvdevani-Bar, Assaf Shamir +5 more | 2021-07-06 |