Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Ishai Schwarzband, Grigory Klebanov +6 more | 2023-05-16 |
| 11476081 | Evaluating an intermediate product related to a three-dimensional NAND memory unit | Roman Kris, Vadim Vereschagin, Assaf Shamir, Elad Sommer, Meng Li Cecilia Lim | 2022-10-18 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover +3 more | 2022-09-13 |
| 11056404 | Evaluating a hole formed in an intermediate product | Roman Kris, Grigory Klebanov, Dhananjay Singh Rathore, Einat Frishman, Assaf Shamir +5 more | 2021-07-06 |