Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11056404 | Evaluating a hole formed in an intermediate product | Roman Kris, Grigory Klebanov, Einat Frishman, Sharon Duvdevani-Bar, Assaf Shamir +5 more | 2021-07-06 |
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2019-07-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2018-03-13 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2016-12-27 |