Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Ran Goldman, Olga Novak +3 more | 2019-07-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Ran Goldman, Olga Novak +3 more | 2018-03-13 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Ran Goldman, Olga Novak +3 more | 2016-12-27 |