Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Olga Novak +3 more | 2019-07-16 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Olga Novak +3 more | 2018-03-13 |
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Yan Ivanchenko, Ishai Schwarzband, Dan Lange +3 more | 2017-11-21 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Olga Novak +3 more | 2016-12-27 |