Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299868 | Control of a manufacturing process using contour curvature analysis of specimens | Ilan BEN-HARUSH, Rafael BISTRITZER | 2025-05-13 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Rafael BISTRITZER, Vadim Vereschagin, Elad Sommer +5 more | 2023-06-27 |
| 11455715 | Epitaxy metrology in fin field effect transistors | Jitendra Pradipkumar Chaudhary, Roman Kris, Ran Alkoken, Sahar LEVIN, Chih-Chieh Chang | 2022-09-27 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Tal Orenstein, Meir Vengrover, Noa Marom +3 more | 2022-09-13 |
| 11056404 | Evaluating a hole formed in an intermediate product | Roman Kris, Grigory Klebanov, Dhananjay Singh Rathore, Sharon Duvdevani-Bar, Assaf Shamir +5 more | 2021-07-06 |
| 6402898 | Coherently controlled laser distillation of chiral enantiomers | Paul Brumer, Moshe Shapiro | 2002-06-11 |