Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347734 | Examination of a hole formed in a semiconductor specimen | Rafael BISTRITZER, Vadim Vereschagin, Grigory Klebanov, Roman Kris, Omer Kerem +2 more | 2025-07-01 |
| 12299868 | Control of a manufacturing process using contour curvature analysis of specimens | Einat Frishman, Rafael BISTRITZER | 2025-05-13 |
| 12272042 | Detection of defects using a computationally efficient segmentation approach | Elad Cohen, Victor EGOROV, Rafael BISTRITZER | 2025-04-08 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Rafael BISTRITZER, Vadim Vereschagin, Elad Sommer, Grigory Klebanov +5 more | 2023-06-27 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover +3 more | 2022-09-13 |