Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12361526 | Reconstruction of a distorted image of an array of structural elements of a specimen | Yehuda Cohen | 2025-07-15 |
| 12347734 | Examination of a hole formed in a semiconductor specimen | Vadim Vereschagin, Grigory Klebanov, Roman Kris, Ilan BEN-HARUSH, Omer Kerem +2 more | 2025-07-01 |
| 12299868 | Control of a manufacturing process using contour curvature analysis of specimens | Einat Frishman, Ilan BEN-HARUSH | 2025-05-13 |
| 12277750 | Identification of an array in a semiconductor specimen | Yehuda Cohen | 2025-04-15 |
| 12272042 | Detection of defects using a computationally efficient segmentation approach | Elad Cohen, Victor EGOROV, Ilan BEN-HARUSH | 2025-04-08 |
| 11953316 | Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles | Anna Levant, Moshe Eliasof, Michael Chemama, Konstantin Chirko | 2024-04-09 |
| 11921063 | Lateral recess measurement in a semiconductor specimen | Michael Chemama, Ron Meiry, Moshe Eliasof, Lior Yaron, Guy Eytan +1 more | 2024-03-05 |
| 11798138 | Reconstruction of a distorted image of an array of structural elements of a specimen | Yehuda Cohen | 2023-10-24 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Vadim Vereschagin, Elad Sommer, Grigory Klebanov +5 more | 2023-06-27 |
| 11645831 | Identification of an array in a semiconductor specimen | Yehuda Cohen | 2023-05-09 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover +3 more | 2022-09-13 |
| 11321835 | Determining three dimensional information | Anna Levant | 2022-05-03 |