| 12361526 |
Reconstruction of a distorted image of an array of structural elements of a specimen |
Yehuda Cohen |
2025-07-15 |
| 12347734 |
Examination of a hole formed in a semiconductor specimen |
Vadim Vereschagin, Grigory Klebanov, Roman Kris, Ilan BEN-HARUSH, Omer Kerem +2 more |
2025-07-01 |
| 12299868 |
Control of a manufacturing process using contour curvature analysis of specimens |
Einat Frishman, Ilan BEN-HARUSH |
2025-05-13 |
| 12277750 |
Identification of an array in a semiconductor specimen |
Yehuda Cohen |
2025-04-15 |
| 12272042 |
Detection of defects using a computationally efficient segmentation approach |
Elad Cohen, Victor EGOROV, Ilan BEN-HARUSH |
2025-04-08 |
| 11953316 |
Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles |
Anna Levant, Moshe Eliasof, Michael Chemama, Konstantin Chirko |
2024-04-09 |
| 11921063 |
Lateral recess measurement in a semiconductor specimen |
Michael Chemama, Ron Meiry, Moshe Eliasof, Lior Yaron, Guy Eytan +1 more |
2024-03-05 |
| 11798138 |
Reconstruction of a distorted image of an array of structural elements of a specimen |
Yehuda Cohen |
2023-10-24 |
| 11686571 |
Local shape deviation in a semiconductor specimen |
Roman Kris, Ilan BEN-HARUSH, Vadim Vereschagin, Elad Sommer, Grigory Klebanov +5 more |
2023-06-27 |
| 11645831 |
Identification of an array in a semiconductor specimen |
Yehuda Cohen |
2023-05-09 |
| 11443420 |
Generating a metrology recipe usable for examination of a semiconductor specimen |
Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover +3 more |
2022-09-13 |
| 11321835 |
Determining three dimensional information |
Anna Levant |
2022-05-03 |
