Patents per Year
Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12456600 | Scanning electron microscopy-based tomography of specimens | Itamar Shani, Konstantin Chirko, Guy Eytan, Guy Shwartz | 2025-10-28 | |
| 11921063 | Lateral recess measurement in a semiconductor specimen | Michael Chemama, Ron Meiry, Moshe Eliasof, Guy Eytan, Konstantin Chirko +1 more | 2024-03-05 | $73,319,000 |
| 11662324 | Three-dimensional surface metrology of wafers | Ido Almog, Ron Bar-Or | 2023-05-30 | $32,229,000 |
| 11264202 | Generating three dimensional information regarding structural elements of a specimen | Konstantin Chirko, Itamar Shani, Albert Karabekov, Guy Eytan, Alon Litman | 2022-03-01 | $41,046,000 |