Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921063 | Lateral recess measurement in a semiconductor specimen | Michael Chemama, Ron Meiry, Moshe Eliasof, Guy Eytan, Konstantin Chirko +1 more | 2024-03-05 |
| 11662324 | Three-dimensional surface metrology of wafers | Ido Almog, Ron Bar-Or | 2023-05-30 |
| 11264202 | Generating three dimensional information regarding structural elements of a specimen | Konstantin Chirko, Itamar Shani, Albert Karabekov, Guy Eytan, Alon Litman | 2022-03-01 |