Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Generating three dimensional information regarding structural elements of a specimen

Generating three dimensional information regarding structural elements of a specimen

US Patent 11264202 · Granted Mar 1, 2022

Estimated economic value: $41,046,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning electron microscopy-based tomography of specimens2025
Scanning electron microscopy-based tomography of specimens2025
Scanning electron microscopy-based tomography of specimens2025
Scanning electron microscopy-based tomography of specimens2025
Hybrid scanning electron microscopy and acousto-optic based metrology2025
Geometry based three dimensional reconstruction of a semiconductor specimen by s2024
Lateral recess measurement in a semiconductor specimen2024
Lateral recess measurement in a semiconductor specimen2024
Lateral recess measurement in a semiconductor specimen2024
Integrated circuit designs for reservoir computing and machine learning2023
Reactive particles supply system2023
Evaluating a contact between a wafer and an electrostatic chuck2023