Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11501951 | X-ray imaging in cross-section using un-cut lamella with background material | Yehuda Zur | 2022-11-15 |
| 11366072 | Detecting backscattered electrons in a multibeam charged particle column | Jacob Levin | 2022-06-21 |
| 11315754 | Adaptive geometry for optimal focused ion beam etching | Ilya Blayvas, Gal Bruner, Yehuda Zur, Alexander Mairov, Ron Davidescu +1 more | 2022-04-26 |
| 11264202 | Generating three dimensional information regarding structural elements of a specimen | Konstantin Chirko, Itamar Shani, Albert Karabekov, Guy Eytan, Lior Yaron | 2022-03-01 |
| 10903044 | Filling empty structures with deposition under high-energy SEM for uniform DE layering | Konstantin Chirko, Yehuda Zur | 2021-01-26 |
| 10714305 | Retractable detector | Efim Vinnitsky | 2020-07-14 |
| 10541104 | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection | Uri Lev, Zvi Nir, Arnon Mizrahy | 2020-01-21 |
| 10211026 | Retractable detector | Efim Vinnitsky | 2019-02-19 |
| 10156785 | Inspection of a lithographic mask that is protected by a pellicle | Nir Ben-David Dodzin, Albert Karabekov, Alex Goldenshtein | 2018-12-18 |
| 10074513 | Multi mode systems with retractable detectors | Efim Vinnitsky, Ofir Arzouan, Igor Petrov | 2018-09-11 |
| 9958501 | System for electrical measurements of objects in a vacuumed environment | Amir Wachs, Efim Vinnitsky | 2018-05-01 |
| 9847209 | Inspection of regions of interest using an electron beam system | Benzion Sender | 2017-12-19 |
| 9818577 | Multi mode system with a dispersion X-ray detector | Efim Vinnitsky | 2017-11-14 |
| 9666412 | Method for charging and imaging an object | Yoram Uziel, Benzion Sender | 2017-05-30 |
| 9632044 | Imaging bottom of high aspect ratio holes | Konstantin Chirko | 2017-04-25 |
| 9470751 | Detecting open and short of conductors | Amir Shoham | 2016-10-18 |
| 9466462 | Inspection of regions of interest using an electron beam system | Benzion Sender | 2016-10-11 |
| 9448253 | Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device | Konstantin Chirko | 2016-09-20 |
| 9366954 | Inspection of a lithographic mask that is protected by a pellicle | Nir Ben-David Dodzin, Albert Karabekov, Alex Goldenshtein | 2016-06-14 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Ofer Adan, Ron Naftali, Juergen Frosien | 2016-03-29 |
| 8389962 | System and method for compensating for magnetic noise | Konstantine Chirko, Yoav Nachum | 2013-03-05 |
| 8207499 | Variable rate scanning in an electron microscope | Amir Shoham, Benzion Sender | 2012-06-26 |
| 7842935 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Yonatan Lehman +2 more | 2010-11-30 |
| 7521700 | Raster frame beam system for electron beam lithography | Meir Aloni, Mula Friedman, Jimmy Vishnipolsky, Gilad Almogy, Yonatan Lehman +2 more | 2009-04-21 |
| 7468506 | Spot grid array scanning system | Steven R. Rogers, Nissim Elmaliach, Emanuel Elyasef, Ron Naftali | 2008-12-23 |