YZ

Yehuda Zur

Applied Materials: 18 patents #731 of 7,310Top 10%
Overall (All Time): #228,313 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12368019 Optimized saddle nozzle design for gas injection system 2025-07-22
12308207 Enhanced deposition rate by thermal isolation cover for GIS manipulator Sean Kashy 2025-05-20
12230473 Temperature-controlled surface with a cryo-nanomanipulator for improved deposition rate 2025-02-18
12033831 Analyzing a sidewall of hole milled in a sample to determine thickness of a buried layer Ilya Blayvas 2024-07-09
11887810 Reduced charging by low negative voltage in FIB systems 2024-01-30
11694934 FIB delayering endpoint detection by monitoring sputtered materials using RGA 2023-07-04
11636997 Uniform milling of adjacent materials using parallel scanning fib 2023-04-25
11626267 Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltage Igor Petrov 2023-04-11
11598633 Analyzing a buried layer of a sample Alexander Mairov, Gal Bruner 2023-03-07
11525791 SNR for x-ray detectors in SEM systems by using polarization filter 2022-12-13
11501951 X-ray imaging in cross-section using un-cut lamella with background material Alon Litman 2022-11-15
11440151 Milling a multi-layered object 2022-09-13
11404244 High-resolution x-ray spectroscopy surface material analysis 2022-08-02
11315754 Adaptive geometry for optimal focused ion beam etching Ilya Blayvas, Gal Bruner, Alexander Mairov, Ron Davidescu, Kfir Dotan +1 more 2022-04-26
11280749 Holes tilt angle measurement using FIB diagonal cut Alexander Mairov 2022-03-22
11276557 Forming a vertical surface 2022-03-15
11199401 End-point detection for similar adjacent materials 2021-12-14
10971618 Generating milled structural elements with a flat upper surface Ron Davidescu 2021-04-06
10903044 Filling empty structures with deposition under high-energy SEM for uniform DE layering Alon Litman, Konstantin Chirko 2021-01-26