Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11953316 | Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles | Rafael BISTRITZER, Anna Levant, Moshe Eliasof, Michael Chemama | 2024-04-09 |
| 11921063 | Lateral recess measurement in a semiconductor specimen | Michael Chemama, Ron Meiry, Moshe Eliasof, Lior Yaron, Guy Eytan +1 more | 2024-03-05 |
| 11264202 | Generating three dimensional information regarding structural elements of a specimen | Itamar Shani, Albert Karabekov, Guy Eytan, Lior Yaron, Alon Litman | 2022-03-01 |
| 10903044 | Filling empty structures with deposition under high-energy SEM for uniform DE layering | Alon Litman, Yehuda Zur | 2021-01-26 |
| 10714306 | Measuring a height profile of a hole formed in non-conductive region | Orit Hava Armon Hershkovich | 2020-07-14 |
| 9632044 | Imaging bottom of high aspect ratio holes | Alon Litman | 2017-04-25 |
| 9448253 | Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device | Alon Litman | 2016-09-20 |
| 8804299 | Electrostatic chuck and a method for supporting a wafer | Guy Eytan, Shmuel Shmulik Nakash | 2014-08-12 |