ME

Moshe Eliasof

Applied Materials: 2 patents #3,641 of 7,310Top 50%
Overall (All Time): #1,751,345 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11953316 Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles Rafael BISTRITZER, Anna Levant, Michael Chemama, Konstantin Chirko 2024-04-09
11921063 Lateral recess measurement in a semiconductor specimen Michael Chemama, Ron Meiry, Lior Yaron, Guy Eytan, Konstantin Chirko +1 more 2024-03-05