Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11921063 | Lateral recess measurement in a semiconductor specimen | Michael Chemama, Ron Meiry, Moshe Eliasof, Lior Yaron, Konstantin Chirko +1 more | 2024-03-05 |
| 11810765 | Reactive particles supply system | Asaf Gutman, Irit Ruach-Nir, Kfir Luria, Sven Ruhle | 2023-11-07 |
| 11694869 | Evaluating a contact between a wafer and an electrostatic chuck | Adam Clay Faust, Yosef Basson, Yonathan David | 2023-07-04 |
| 11355309 | Sensor for electron detection | Itay Assulin, Jacob Levin | 2022-06-07 |
| 11264202 | Generating three dimensional information regarding structural elements of a specimen | Konstantin Chirko, Itamar Shani, Albert Karabekov, Lior Yaron, Alon Litman | 2022-03-01 |
| 11189451 | Charged particle beam source and a method for assembling a charged particle beam source | Itay Asulin, Ofer Yuli, Lavy Shavit, Yoram Uziel, Natan Schlimoff +3 more | 2021-11-30 |
| 11049704 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Michal Eilon, Magen Yaacov Schulman, Sven Ruhle, Manuel Radek +1 more | 2021-06-29 |
| 10910204 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Michal Eilon, Magen Yaacov Schulman | 2021-02-02 |
| 10886092 | Charged particle beam source and a method for assembling a charged particle beam source | Itay Asulin, Ofer Yuli, Lavy Shavit, Yoram Uziel, Natan Schlimoff +3 more | 2021-01-05 |
| 10716197 | System, computer program product, and method for dissipation of an electrical charge | Emil Weisz, Samuel Ives Nackash, Albert Karabekov | 2020-07-14 |
| 10249472 | Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device | Dieter Winkler, Zvi Nir | 2019-04-02 |
| 10217621 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Michal Eilon, Magen Yaacov Schulman | 2019-02-26 |
| 8804299 | Electrostatic chuck and a method for supporting a wafer | Shmuel Shmulik Nakash, Konstantin Chirko | 2014-08-12 |
| 7235794 | System and method for inspecting charged particle responsive resist | Benzion Sender, Ophir Dror | 2007-06-26 |