Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12480898 | Z-profiling of wafers based on X-ray measurements | Doron Girmonsky, Dror Shemesh, Uri Hadar | 2025-11-25 | |
| 11049704 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Guy Eytan, Magen Yaacov Schulman, Sven Ruhle, Manuel Radek +1 more | 2021-06-29 | $47,858,000 |
| 10910204 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Guy Eytan, Magen Yaacov Schulman | 2021-02-02 | $74,085,000 |
| 10217621 | Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber | Irit Ruach-Nir, Guy Eytan, Magen Yaacov Schulman | 2019-02-26 | $27,960,000 |
| 8361814 | Method for monitoring chamber cleanliness | Dror Shemesh, Hen Doozli, Ekaterina Rechav, Eitan Binyamini | 2013-01-29 | $6,154,000 |