Issued Patents All Time
Showing 1–25 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362131 | Method for inspecting a specimen and charged particle beam device | Pieter Kruit, Ron Naftali, Jürgen Frosien, Ralf Schmid, Benjamin John Cook +1 more | 2025-07-15 |
| 11501946 | Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus | Benjamin John Cook, Bernd Woellert | 2022-11-15 |
| 11495433 | Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen | Benjamin John Cook, Markus Thomann, Thomas Kemen, Roman Barday | 2022-11-08 |
| 11239043 | Charged particle beam device and method for inspecting and/or imaging a sample | Bernd Wöllert, Birgit Schabinger | 2022-02-01 |
| 11232924 | Method of operating a charged particle gun, charged particle gun, and charged particle beam device | — | 2022-01-25 |
| 11183361 | Charged particle beam device and method for inspecting and/or imaging a sample | Bernd Wöllert, Birgit Schabinger | 2021-11-23 |
| 10978270 | Charged particle beam device, interchangeable multi-aperture arrangement for a charged particle beam device, and method for operating a charged particle beam device | Thomas Jasinski | 2021-04-13 |
| 10861666 | Method of operating a charged particle gun, charged particle gun, and charged particle beam device | — | 2020-12-08 |
| 10748743 | Device and method for operating a charged particle device with multiple beamlets | Benjamin John Cook, Ralf Schmid | 2020-08-18 |
| 10593509 | Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device | Benjamin John Cook | 2020-03-17 |
| 10483080 | Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device | Benjamin John Cook | 2019-11-19 |
| 10249472 | Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device | Guy Eytan, Zvi Nir | 2019-04-02 |
| 10103004 | System and method for imaging a secondary charged particle beam with adaptive secondary charged particle optics | Matthias Firnkes, Stefan Lanio | 2018-10-16 |
| 9953805 | System for imaging a secondary charged particle beam with adaptive secondary charged particle optics | Matthias Firnkes, Stefan Lanio | 2018-04-24 |
| 9754759 | Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device | Benjamin John Cook | 2017-09-05 |
| 9620329 | Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device | Benjamin John Cook | 2017-04-11 |
| 9431210 | Charged particle beam device with dynamic focus and method of operating thereof | Igor Petrov | 2016-08-30 |
| 9035249 | Multi-beam system for high throughput EBI | Jürgen Frosien, Benjamin John Cook | 2015-05-19 |
| 8963083 | Switchable multi perspective detector, optics therefore and method of operating thereof | Matthias Firnkes, Stefan Lanio, Gerald Schonecker | 2015-02-24 |
| 8793972 | Gas turbine installation with flue gas recirculation dependent on oxygen content of a gas flow | Andreas Brautsch, Richard Carroni | 2014-08-05 |
| 8785849 | Ultra high precision measurement tool | Juergen Frosien, Udo Weigel, Stefan Grimm | 2014-07-22 |
| 8735847 | High resolution gas field ion column with reduced sample load | Helmut Banzhof, Juergen Frosien | 2014-05-27 |
| 8723117 | Switchable multi perspective detector, optics therefor and method of operating thereof | Stefan Lanio, Gerald Schonecker | 2014-05-13 |
| 8563927 | Shielding member having a charge control electrode, and a charged particle beam apparatus | Stefan Lanio | 2013-10-22 |
| 8330130 | Charged particle source with automated tip formation | Udo Weigel, Stefan Grimm | 2012-12-11 |