Issued Patents All Time
Showing 1–25 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10177048 | System for inspecting and reviewing a sample | Jacob Levin, Igor Krivts (Krayvitz), Yoram Uziel, Boris Golberg | 2019-01-08 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Alon Litman, Ofer Adan, Ron Naftali | 2016-03-29 |
| 9153413 | Multi-beam scanning electron beam device and methods of using the same | Gilad Almogy, Avishai Bartov, Pavel Adamec, Helmut Banzhof | 2015-10-06 |
| 8785849 | Ultra high precision measurement tool | Dieter Winkler, Udo Weigel, Stefan Grimm | 2014-07-22 |
| 8735847 | High resolution gas field ion column with reduced sample load | Helmut Banzhof, Dieter Winkler | 2014-05-27 |
| 8445846 | Beam optical component having a charged particle lens | — | 2013-05-21 |
| 8158939 | High resolution gas field ion column | Dieter Winkler | 2012-04-17 |
| 8049180 | Achromatic mass separator | Helmut Banzhof | 2011-11-01 |
| 8026492 | Dual mode gas field ion source | Dieter Winkler | 2011-09-27 |
| 7968855 | Dual mode gas field ion source | — | 2011-06-28 |
| 7947953 | Charged particle detection apparatus and detection method | — | 2011-05-24 |
| 7939800 | Arrangement and method for compensating emitter tip vibrations | — | 2011-05-10 |
| 7919749 | Energy filter for cold field emission electron beam apparatus | Fang Zhou, Pavel Adamec | 2011-04-05 |
| 7851768 | Ultra high precision measurement tool with control loop | — | 2010-12-14 |
| 7838830 | Charged particle beam apparatus and method for operating a charged particle beam apparatus | Helmut Banzhof, Jacob Levin, Dror Shemesh | 2010-11-23 |
| 7829870 | Method and apparatus for in-situ sample preparation | — | 2010-11-09 |
| 7800075 | Multi-function module for an electron beam column | Benyamin Buller, William J. DeVore, Xinrong Jiang, Richard L. Lozes, Henry Pearce-Percy +3 more | 2010-09-21 |
| 7675042 | Beam optical component for charged particle beams | — | 2010-03-09 |
| 7663102 | High current density particle beam system | — | 2010-02-16 |
| 7629578 | Charged particle beam device | Yacov Elgar | 2009-12-08 |
| 7592590 | Charged particle beam device with detection unit switch and method of operation thereof | — | 2009-09-22 |
| 7589328 | Gas field ION source for multiple applications | Dieter Winkler | 2009-09-15 |
| 7544937 | Charged particle beam device for high spatial resolution and multiple perspective imaging | — | 2009-06-09 |
| 7514682 | Electron anti-fogging baffle used as a detector | Benyamin Buller, William J. DeVore, Richard L. Lozes, Henry Pearce-Percy, Dieter Winkler | 2009-04-07 |
| 7465939 | Aberration correction device and method for operating same | — | 2008-12-16 |