Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11469072 | Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus | — | 2022-10-11 |
| 10504684 | High performance inspection scanning electron microscope device and method of operating the same | — | 2019-12-10 |
| 9847208 | Electron beam device, cold field emitter, and method for regeneration of a cold field emitter | — | 2017-12-19 |
| 9673017 | Housing device for magnetic shielding, housing arrangement for magnetic shielding, charged particle beam device, and method of manufacturing a housing device | — | 2017-06-06 |
| 9633815 | Emitter for an electron beam, electron beam device and method for producing and operating an electron emitter | Harry Kleinschmidt | 2017-04-25 |
| 9153413 | Multi-beam scanning electron beam device and methods of using the same | Gilad Almogy, Avishai Bartov, Juergen Frosien, Helmut Banzhof | 2015-10-06 |
| 8987692 | High brightness electron gun, system using the same, and method of operating thereof | — | 2015-03-24 |
| 8957390 | Electron gun arrangement | — | 2015-02-17 |
| 8878148 | Method and apparatus of pretreatment of an electron gun chamber | Ivo Li{hacek over (s)}ka, Gennadij Gluchman, Milan Snabl | 2014-11-04 |
| 8674300 | Feedback loop for emitter flashing | — | 2014-03-18 |
| 8618500 | Multi channel detector, optics therefor and method of operating thereof | — | 2013-12-31 |
| 8530837 | Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen | — | 2013-09-10 |
| 8164067 | Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen | Helmut Banzhof, Ivo Liska | 2012-04-24 |
| 8101911 | Method and device for improved alignment of a high brightness charged particle gun | — | 2012-01-24 |
| 8044368 | Lens coil cooling of a magnetic lens | — | 2011-10-25 |
| 8008629 | Charged particle beam device and method for inspecting specimen | Shemesh Dror | 2011-08-30 |
| 7982179 | Beam current calibration system | Fang Zhou | 2011-07-19 |
| 7932495 | Fast wafer inspection system | — | 2011-04-26 |
| 7928403 | Multiple lens assembly and charged particle beam device comprising the same | — | 2011-04-19 |
| 7928405 | Magnetic lens assembly | Carlo Salvesen, Ivo Liska | 2011-04-19 |
| 7919749 | Energy filter for cold field emission electron beam apparatus | Fang Zhou, Juergen Frosien | 2011-04-05 |
| 7872239 | Electrostatic lens assembly | Carlo Salvesen, Ivo Liska | 2011-01-18 |
| 7847267 | Scanning electron microscope having multiple detectors and a method for multiple detector based imaging | Dror Shemesh | 2010-12-07 |
| 7842930 | Charged particle detector assembly, charged particle beam apparatus and method for generating an image | Gilad Almogy, Dror Shemesh | 2010-11-30 |
| 7800062 | Method and system for the examination of specimen | Alex Goldenshtein, Radel Ben-Av, Asher Pearl, Igor Petrov, Nadav Haas +1 more | 2010-09-21 |