Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7800062 | Method and system for the examination of specimen | Alex Goldenshtein, Asher Pearl, Igor Petrov, Nadav Haas, Pavel Adamec +1 more | 2010-09-21 |
| 6894435 | Method and device for rastering source redundancy | David Aviel, Jimmy Vishnipolsky | 2005-05-17 |