Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11626267 | Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltage | Yehuda Zur | 2023-04-11 |
| 11264198 | Objective lens arrangement | Zvika Rosenberg, Arie Bader | 2022-03-01 |
| 10074513 | Multi mode systems with retractable detectors | Alon Litman, Efim Vinnitsky, Ofir Arzouan | 2018-09-11 |
| 10007537 | Method for targeted resource virtualization in containers | Pavel Emelyanov, Stanislav S. Protassov, Serguei M. Beloussov | 2018-06-26 |
| 9431210 | Charged particle beam device with dynamic focus and method of operating thereof | Dieter Winkler | 2016-08-30 |
| 9348622 | Method for targeted resource virtualization in containers | Pavel Emelyanov, Stanislav S. Protassov, Serguei M. Beloussov | 2016-05-24 |
| 8389584 | Nanodiamond material, method and device for purifying and modifying a nanodiamond | Yuriy Alekseevich Skryabin, Olga Aleksandrovna Shenderova | 2013-03-05 |
| 7800062 | Method and system for the examination of specimen | Alex Goldenshtein, Radel Ben-Av, Asher Pearl, Nadav Haas, Pavel Adamec +1 more | 2010-09-21 |
| 7525091 | Charged particle beam system and a method for inspecting a sample | Guy Eitan, Albert Karabekov | 2009-04-28 |
| 7317606 | Particle trap for electrostatic chuck | Igor Krivts (Krayvitz), Eitan Kidron, Guy Eitan, Igal Ben-Dayan | 2008-01-08 |
| 7233008 | Multiple electrode lens arrangement and a method for inspecting an object | Dror Shemesh | 2007-06-19 |
| 7223974 | Charged particle beam column and method for directing a charged particle beam | Zvika Rosenberg | 2007-05-29 |
| 7170068 | Method and system for discharging a sample | Oren Zoran, Juergen Frosien | 2007-01-30 |
| 7112803 | Beam directing system and method for use in a charged particle beam column | Igor Krivts (Krayvitz), Albert Karabekov | 2006-09-26 |
| 7067807 | Charged particle beam column and method of its operation | Pavel Adamec, Zvika Rosenberg | 2006-06-27 |
| 7034297 | Method and system for use in the monitoring of samples with a charged particle beam | Zvika Rosenberg, Pavel Adamec, Igor Krayvitz | 2006-04-25 |
| 6897442 | Objective lens arrangement for use in a charged particle beam column | — | 2005-05-24 |
| 6825475 | Deflection method and system for use in a charged particle beam column | Igor Krivts, Zvika Rosenberg, Pavel Adamec | 2004-11-30 |
| 6674075 | Charged particle beam apparatus and method for inspecting samples | Zvika Rosenberg | 2004-01-06 |
| 6380546 | Focusing assembly and method for a charged particle beam column | Bezalel Rechav | 2002-04-30 |