Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
IP

Igor Petrov — 20 Patents

Applied Materials: 16 patents #853 of 7,310Top 15%
IFInternational Technology Center Fzc: 1 patents #12 of 27Top 45%
PAParallels: 1 patents #14 of 28Top 50%
PGParallels Ip Holdings Gmbh: 1 patents #38 of 71Top 55%
Holon, IL: #30 of 1,062 inventorsTop 3%
Overall (All Time): #214,803 of 4,157,543Top 6%
20 Patents All Time
Igor Petrov has been granted 20 US patents while listed as an inventor at Applied Materials. The first was granted in 2002 and the most recent in April 2023. Igor Petrov ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Igor Petrov in Holon, IL.

Patents per Year

Patents granted per year, 2002 to 2023Bar chart with a peak of 3 patents in 2006.peak 32002: 1 patents20022004: 2 patents2005: 1 patents20052006: 3 patents2007: 3 patents20072008: 1 patents2009: 1 patents20092010: 1 patents2013: 1 patents20132016: 2 patents2018: 2 patents20182022: 1 patents2023: 1 patents2023

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11626267 Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltage Yehuda Zur 2023-04-11 $32,726,000
11264198 Objective lens arrangement Zvika Rosenberg, Arie Bader 2022-03-01 $41,046,000
10074513 Multi mode systems with retractable detectors Alon Litman, Efim Vinnitsky, Ofir Arzouan 2018-09-11 $27,448,000
10007537 Method for targeted resource virtualization in containers Pavel Emelyanov, Stanislav S. Protassov, Serguei M. Beloussov 2018-06-26
9431210 Charged particle beam device with dynamic focus and method of operating thereof Dieter Winkler 2016-08-30
9348622 Method for targeted resource virtualization in containers Pavel Emelyanov, Stanislav S. Protassov, Serguei M. Beloussov 2016-05-24
8389584 Nanodiamond material, method and device for purifying and modifying a nanodiamond Yuriy Alekseevich Skryabin, Olga Aleksandrovna Shenderova 2013-03-05
7800062 Method and system for the examination of specimen Alex Goldenshtein, Radel Ben-Av, Asher Pearl, Nadav Haas, Pavel Adamec +1 more 2010-09-21 $8,059,000
7525091 Charged particle beam system and a method for inspecting a sample Guy Eitan, Albert Karabekov 2009-04-28 $40,327,000
7317606 Particle trap for electrostatic chuck Igor Krivts (Krayvitz), Eitan Kidron, Guy Eitan, Igal Ben-Dayan 2008-01-08 $14,915,000
7233008 Multiple electrode lens arrangement and a method for inspecting an object Dror Shemesh 2007-06-19 $24,732,000
7223974 Charged particle beam column and method for directing a charged particle beam Zvika Rosenberg 2007-05-29 $18,482,000
7170068 Method and system for discharging a sample Oren Zoran, Juergen Frosien 2007-01-30 $23,548,000
7112803 Beam directing system and method for use in a charged particle beam column Igor Krivts (Krayvitz), Albert Karabekov 2006-09-26 $15,511,000
7067807 Charged particle beam column and method of its operation Pavel Adamec, Zvika Rosenberg 2006-06-27 $13,196,000
7034297 Method and system for use in the monitoring of samples with a charged particle beam Zvika Rosenberg, Pavel Adamec, Igor Krayvitz 2006-04-25 $23,796,000
6897442 Objective lens arrangement for use in a charged particle beam column 2005-05-24 $9,995,000
6825475 Deflection method and system for use in a charged particle beam column Igor Krivts, Zvika Rosenberg, Pavel Adamec 2004-11-30 $15,899,000
6674075 Charged particle beam apparatus and method for inspecting samples Zvika Rosenberg 2004-01-06 $45,040,000
6380546 Focusing assembly and method for a charged particle beam column Bezalel Rechav 2002-04-30 $26,677,000