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Igor Krivts (Krayvitz)

Applied Materials: 16 patents #838 of 7,310Top 15%
Overall (All Time): #316,536 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11294164 Integrated system and method Yoram Uziel, Albert Mariasin, Nir Merry, Rami Elichai, Zvi Goren 2022-04-05
11189451 Charged particle beam source and a method for assembling a charged particle beam source Itay Asulin, Ofer Yuli, Lavy Shavit, Yoram Uziel, Guy Eytan +3 more 2021-11-30
11177048 Method and system for evaluating objects Efim Vinnitsky, Yoram Uziel, Benzion Sender, Ron Naftali 2021-11-16
11049704 Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber Irit Ruach-Nir, Michal Eilon, Guy Eytan, Magen Yaacov Schulman, Sven Ruhle +1 more 2021-06-29
10886092 Charged particle beam source and a method for assembling a charged particle beam source Itay Asulin, Ofer Yuli, Lavy Shavit, Yoram Uziel, Guy Eytan +3 more 2021-01-05
10177048 System for inspecting and reviewing a sample Juergen Frosien, Jacob Levin, Yoram Uziel, Boris Golberg 2019-01-08
10056274 System and method for forming a sealed chamber Michael R. Rice, Paul B. Reuter, William (Ty) Weaver, Travis Morey, Natan Schlimoff +3 more 2018-08-21
10049904 Method and system for moving a substrate Ofer Adan, Israel Avneri, Yoram Uziel, Niranjan Ramchandra Khasgiwale 2018-08-14
9997328 System and method for forming a sealed chamber Michael R. Rice, Ron Naftali, Natan Schlimoff, Israel Avneri, Yoram Uziel +3 more 2018-06-12
9829809 System and method for attaching a mask to a mask holder Israel Avneri, Yoram Uziel, Nir Ben-David Dodzin, Ido Holcman 2017-11-28
9587749 Slit valve with a pressurized gas bearing Michael R. Rice, Natan Schlimoff, Israel Avneri, Yoram Uziel, Erez Admoni +2 more 2017-03-07
8772737 Conductive element for electrically coupling an EUVL mask to a supporting chuck Israel Avneri, Yoram Uziel, Nir Ben-David Dodzin, Ido Holcman, Itzak Yair +1 more 2014-07-08
7428850 Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system Ron Naftali, Yoram Uziel, Ran Vered, Eitan Pinhasi 2008-09-30
7317606 Particle trap for electrostatic chuck Igor Petrov, Eitan Kidron, Guy Eitan, Igal Ben-Dayan 2008-01-08
7112803 Beam directing system and method for use in a charged particle beam column Igor Petrov, Albert Karabekov 2006-09-26