Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10545020 | System, a method and a computer program product for size estimation | Moshe Amzaleg | 2020-01-28 |
| 10290092 | System, a method and a computer program product for fitting based defect detection | Moshe Amzaleg | 2019-05-14 |
| 10156785 | Inspection of a lithographic mask that is protected by a pellicle | Alon Litman, Albert Karabekov, Alex Goldenshtein | 2018-12-18 |
| 9829809 | System and method for attaching a mask to a mask holder | Israel Avneri, Igor Krivts (Krayvitz), Yoram Uziel, Ido Holcman | 2017-11-28 |
| 9366954 | Inspection of a lithographic mask that is protected by a pellicle | Alon Litman, Albert Karabekov, Alex Goldenshtein | 2016-06-14 |
| 9355443 | System, a method and a computer program product for CAD-based registration | Zvi Goren | 2016-05-31 |
| 9235885 | System, a method and a computer program product for patch-based defect detection | Moshe Amzaleg, Vered Gatt, Yair Hanani, Efrat Rozenman | 2016-01-12 |
| 9070014 | System, method and computer program product for defect detection based on multiple references | Moshe Amzaleg, Yehuda Cohen, Efrat Rozenman | 2015-06-30 |
| 9070180 | Method, system, and computer program product for detection of defects based on multiple references | Moshe Amzaleg, Yehuda Cohen, Efrat Rozenman | 2015-06-30 |
| 8855399 | System, a method and a computer program product for CAD-based registration | Zvi Goren | 2014-10-07 |
| 8772737 | Conductive element for electrically coupling an EUVL mask to a supporting chuck | Igor Krivts (Krayvitz), Israel Avneri, Yoram Uziel, Ido Holcman, Itzak Yair +1 more | 2014-07-08 |
| 8498470 | Method and system for evaluating an object | Vered Gatt | 2013-07-30 |
| 8249331 | Method and system for evaluating an object | Vered Gatt | 2012-08-21 |