Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320758 | System and method for inspection of multiple features of patterned objects in the manufacture of electrical circuits | Itzhak Saki Hakim, Chay Goldenberg, Mordehay Amirim | 2025-06-03 |
| 9235885 | System, a method and a computer program product for patch-based defect detection | Moshe Amzaleg, Nir Ben-David Dodzin, Yair Hanani, Efrat Rozenman | 2016-01-12 |
| 8498470 | Method and system for evaluating an object | Nir Ben-David Dodzin | 2013-07-30 |
| 8249331 | Method and system for evaluating an object | Nir Ben-David Dodzin | 2012-08-21 |