Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10545490 | Method of inspecting a specimen and system thereof | Michele Dalla-Torre, Amit Batikoff, Ron Katzir, Imry Kissos | 2020-01-28 |
| 10043264 | Integration of automatic and manual defect classification | Gadi Greenberg, Idan Kaizerman | 2018-08-07 |
| 9858658 | Defect classification using CAD-based context attributes | Idan Kaizerman, Ishai Schwarzband | 2018-01-02 |
| 9851714 | Method of inspecting a specimen and system thereof | Michele Dalla-Torre, Amit Batikoff, Ron Katzir, Imry Kissos | 2017-12-26 |
| 9767356 | System, method and computer program product for defect detection based on multiple references | Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzen | 2017-09-19 |
| 9715723 | Optimization of unknown defect rejection for automatic defect classification | Vladimir Shlain, Gadi Greenberg, Idan Kaizerman | 2017-07-25 |
| 9613255 | Systems, methods and computer program products for signature detection | Moshe Amzaleg, Ariel Shkalim | 2017-04-04 |
| 9607233 | Classifier readiness and maintenance in automatic defect classification | Idan Kaizerman, Vladimir Shlain | 2017-03-28 |
| 9595091 | Defect classification using topographical attributes | Idan Kaizerman, Ishai Schwarzband | 2017-03-14 |
| 9558548 | Method, system, and computer program product for detection of defects based on multiple references | Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzen | 2017-01-31 |
| 9401013 | Method of design-based defect classification and system thereof | Mark Geshel, Zvi Goren | 2016-07-26 |
| 9235885 | System, a method and a computer program product for patch-based defect detection | Moshe Amzaleg, Nir Ben-David Dodzin, Vered Gatt, Yair Hanani | 2016-01-12 |
| 9070014 | System, method and computer program product for defect detection based on multiple references | Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzin | 2015-06-30 |
| 9070180 | Method, system, and computer program product for detection of defects based on multiple references | Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzin | 2015-06-30 |
| 7847929 | Methods and apparatus for inspecting a plurality of dies | Tuvia Dror Kutscher, Zvi Goren, Rami Elichai | 2010-12-07 |
| 7410737 | System and method for process variation monitor | Evgeni Levin, Gilad Almogy | 2008-08-12 |
| 7054480 | System and method for process variation monitor | Evgeni Levin, Gilad Almogy | 2006-05-30 |
| 6862491 | System and method for process variation monitor | Evgeni Levin, Gilad Almogy | 2005-03-01 |