| 10545490 |
Method of inspecting a specimen and system thereof |
Michele Dalla-Torre, Amit Batikoff, Ron Katzir, Imry Kissos |
2020-01-28 |
$24,189,000 |
| 10043264 |
Integration of automatic and manual defect classification |
Gadi Greenberg, Idan Kaizerman |
2018-08-07 |
$22,921,000 |
| 9858658 |
Defect classification using CAD-based context attributes |
Idan Kaizerman, Ishai Schwarzband |
2018-01-02 |
$37,336,000 |
| 9851714 |
Method of inspecting a specimen and system thereof |
Michele Dalla-Torre, Amit Batikoff, Ron Katzir, Imry Kissos |
2017-12-26 |
$19,032,000 |
| 9767356 |
System, method and computer program product for defect detection based on multiple references |
Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzen |
2017-09-19 |
$15,798,000 |
| 9715723 |
Optimization of unknown defect rejection for automatic defect classification |
Vladimir Shlain, Gadi Greenberg, Idan Kaizerman |
2017-07-25 |
$35,016,000 |
| 9613255 |
Systems, methods and computer program products for signature detection |
Moshe Amzaleg, Ariel Shkalim |
2017-04-04 |
$16,159,000 |
| 9607233 |
Classifier readiness and maintenance in automatic defect classification |
Idan Kaizerman, Vladimir Shlain |
2017-03-28 |
$28,144,000 |
| 9595091 |
Defect classification using topographical attributes |
Idan Kaizerman, Ishai Schwarzband |
2017-03-14 |
$16,778,000 |
| 9558548 |
Method, system, and computer program product for detection of defects based on multiple references |
Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzen |
2017-01-31 |
$44,860,000 |
| 9401013 |
Method of design-based defect classification and system thereof |
Mark Geshel, Zvi Goren |
2016-07-26 |
$40,439,000 |
| 9235885 |
System, a method and a computer program product for patch-based defect detection |
Moshe Amzaleg, Nir Ben-David Dodzin, Vered Gatt, Yair Hanani |
2016-01-12 |
$9,921,000 |
| 9070014 |
System, method and computer program product for defect detection based on multiple references |
Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzin |
2015-06-30 |
$11,421,000 |
| 9070180 |
Method, system, and computer program product for detection of defects based on multiple references |
Moshe Amzaleg, Yehuda Cohen, Nir Ben-David Dodzin |
2015-06-30 |
$11,421,000 |
| 7847929 |
Methods and apparatus for inspecting a plurality of dies |
Tuvia Dror Kutscher, Zvi Goren, Rami Elichai |
2010-12-07 |
$3,240,000 |
| 7410737 |
System and method for process variation monitor |
Evgeni Levin, Gilad Almogy |
2008-08-12 |
$95,282,000 |
| 7054480 |
System and method for process variation monitor |
Evgeni Levin, Gilad Almogy |
2006-05-30 |
$15,443,000 |
| 6862491 |
System and method for process variation monitor |
Evgeni Levin, Gilad Almogy |
2005-03-01 |
$61,828,000 |
