Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Amit Batikoff — 19 Patents

Applied Materials: 16 patents #853 of 7,310Top 15%
General Motors: 3 patents #4,723 of 18,328Top 30%
Petah Tikva, IL: #33 of 659 inventorsTop 6%
Overall (All Time): #229,345 of 4,157,543Top 6%
19 Patents All Time
Amit Batikoff has been granted 19 US patents while listed as an inventor at Applied Materials. The first was granted in 2015 and the most recent in April 2025. Amit Batikoff ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Amit Batikoff in Petah Tikva, IL.

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12269500 Alignment validation in vehicle-based sensors Michael Baltaxe, Dan Levi, Noa Garnett, Doron Portnoy, Shahar Ben Ezra +1 more 2025-04-08
12183066 Method of deep learning-based examination of a semiconductor specimen and system thereof Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more 2024-12-31 $49,330,000
11568565 Rendering-based lidar and camera alignment Doron Portnoy 2023-01-31 $54,071,000
11348001 Method of deep learning-based examination of a semiconductor specimen and system thereof Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more 2022-05-31 $62,587,000
11292487 Methods and systems for controlling automated driving features of a vehicle Jeremy P. Gray, Nikhil L. Hoskeri 2022-04-05 $30,431,000
11205119 Method of deep learning-based examination of a semiconductor specimen and system thereof Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more 2021-12-21 $167,553,000
11010665 Method of deep learning-based examination of a semiconductor specimen and system thereof Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more 2021-05-18 $51,490,000
10928437 Method of inspecting a specimen and system thereof Zvi Goren, Adi Boehm 2021-02-23 $34,793,000
10902620 Registration between an image of an object and a description Shaul Cohen, Lavi Jacov Shachar 2021-01-26 $35,448,000
10571406 Method of performing metrology operations and system thereof Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Shaul Cohen, Noam Zac 2020-02-25 $22,337,000
10545490 Method of inspecting a specimen and system thereof Michele Dalla-Torre, Efrat Rozenman, Ron Katzir, Imry Kissos 2020-01-28 $24,189,000
10444274 Method of inspecting a specimen and system thereof Zvi Goren, Adi Boehm 2019-10-15 $25,920,000
10430938 Method of detecting defects in an object Doron Portnoy 2019-10-01 $20,010,000
10296702 Method of performing metrology operations and system thereof Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Shaul Cohen, Noam Zac 2019-05-21 $30,257,000
10120973 Method of performing metrology operations and system thereof Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Shaul Cohen, Noam Zac 2018-11-06 $24,517,000
10012689 Method of inspecting a specimen and system thereof Zvi Goren, Adi Boehm 2018-07-03 $29,604,000
9851714 Method of inspecting a specimen and system thereof Michele Dalla-Torre, Efrat Rozenman, Ron Katzir, Imry Kissos 2017-12-26 $19,032,000
9098893 System, method and computer program product for classification within inspection images Michele Dalla-Torre, Gil Shabat, Adi Dafni 2015-08-04 $15,119,000
8977035 System, method and computer program product for detection of defects within inspection images Michele Dalla-Torre, Gil Shabat, Adi Dafni 2015-03-10 $17,071,000