Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System, method and computer program product for detection of defects within inspection images

System, method and computer program product for detection of defects within inspection images

US Patent 8977035 · Granted Mar 10, 2015

Estimated economic value: $17,071,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Alignment validation in vehicle-based sensors2025
Method of deep learning-based examination of a semiconductor specimen and system2024
System and method for navigating a device through a path to a target location2024
Fast and accurate machine learning by applying efficient preconditioner to kerne2023
Rendering-based lidar and camera alignment2023
Method of deep learning-based examination of a semiconductor specimen and system2022
Methods and systems for controlling automated driving features of a vehicle2022
Method of deep learning-based examination of a semiconductor specimen and system2021
Method of deep learning-based examination of a semiconductor specimen and system2021
Method of inspecting a specimen and system thereof2021
Registration between an image of an object and a description2021
System and method for anomaly detection in dynamically evolving data using hybri2020