Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12260543 | Machine learning based examination of a semiconductor specimen and training thereof | Tal Ben-Shlomo, Shalom Elkayam, Tomer Peled | 2025-03-25 |
| 11854184 | Determination of defects and/or edge roughness in a specimen based on a reference image | Shalom Elkayam, Noam Zac | 2023-12-26 |
| 11631179 | Segmentation of an image of a semiconductor specimen | Elad Ben Baruch, Shalom Elkayam, Tal Ben-Shlomo | 2023-04-18 |
| 11232550 | Generating a training set usable for examination of a semiconductor specimen | Elad Ben Baruch, Shalom Elkayam, Tal Ben-Shlomo | 2022-01-25 |
| 11022566 | Examination of a semiconductor specimen | Dror Alumot, Shalom Elkayam | 2021-06-01 |
| 10902620 | Registration between an image of an object and a description | Amit Batikoff, Lavi Jacov Shachar | 2021-01-26 |
| 10571406 | Method of performing metrology operations and system thereof | Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Amit Batikoff, Noam Zac | 2020-02-25 |
| 10504693 | Evaluating an object | Shay Attal, Guy Maoz, Noam Zac, Mor Baram, Lee Moldovan +4 more | 2019-12-10 |
| 10296702 | Method of performing metrology operations and system thereof | Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Amit Batikoff, Noam Zac | 2019-05-21 |
| 10120973 | Method of performing metrology operations and system thereof | Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Amit Batikoff, Noam Zac | 2018-11-06 |