Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828714 | Image acquisition by an electron beam examination tool for metrology measurement | Bobin Mathew SKARIA, Anirban Ghosh, Nitin Singh Malik | 2023-11-28 |
| 11263741 | System and methods of generating comparable regions of a lithographic mask | Boaz Cohen, Gadi Greenberg, Sivan Lifschitz, Oded O. Dassa, Ziv Parizat | 2022-03-01 |
| 11054753 | Overlay monitoring | Vladislav Kaplan, Lavi Jacov Shachar, Kevin Ryan HOUCHENS | 2021-07-06 |
| 10504693 | Evaluating an object | Shaul Cohen, Guy Maoz, Noam Zac, Mor Baram, Lee Moldovan +4 more | 2019-12-10 |
| 9927375 | System and method for printability based inspection | Ori Petel, Sergey Latinsky, Sergey Khristo, Boaz Cohen | 2018-03-27 |