Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
| 10636140 | Technique for inspecting semiconductor wafers | Ishai Schwarzband, Yan Avniel | 2020-04-28 |
| 9927375 | System and method for printability based inspection | Shay Attal, Ori Petel, Sergey Latinsky, Boaz Cohen | 2018-03-27 |
| 8327298 | System and method for evaluating error sources associated with a mask | Lev Faivishevsky, Amir Sagiv, Shmuel Mangan | 2012-12-04 |