Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Yan Avniel, Sergey Khristo, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
| 10504693 | Evaluating an object | Shay Attal, Shaul Cohen, Guy Maoz, Noam Zac, Lee Moldovan +4 more | 2019-12-10 |
| 9899185 | Resolving ambiguities in an energy spectrum | Dror Shemesh | 2018-02-20 |