Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11995848 | Image generation for examination of a semiconductor specimen | David Uliel, Bobin Mathew SKARIA, Oz Fox-Kahana, Gal Daniel Gutterman, Atai Baldinger +2 more | 2024-05-28 |
| 11301983 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2022-04-12 |
| 10748272 | Measuring height difference in patterns on semiconductor wafers | Ishai Schwarzband, Sergey Khristo, Mor Baram, Shimon Levi, Doron Girmonsky +1 more | 2020-08-18 |
| 10636140 | Technique for inspecting semiconductor wafers | Ishai Schwarzband, Sergey Khristo | 2020-04-28 |