Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11995848 | Image generation for examination of a semiconductor specimen | David Uliel, Yan Avniel, Oz Fox-Kahana, Gal Daniel Gutterman, Atai Baldinger +2 more | 2024-05-28 |
| 11828714 | Image acquisition by an electron beam examination tool for metrology measurement | Anirban Ghosh, Nitin Singh Malik, Shay Attal | 2023-11-28 |