Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828714 | Image acquisition by an electron beam examination tool for metrology measurement | Bobin Mathew SKARIA, Anirban Ghosh, Shay Attal | 2023-11-28 |
NM
Nitin Singh Malik
Overall (All Time): #2,623,103 of 4,157,543Top 65%
1
Patents All Time