Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11995848 | Image generation for examination of a semiconductor specimen | David Uliel, Yan Avniel, Bobin Mathew SKARIA, Oz Fox-Kahana, Atai Baldinger +2 more | 2024-05-28 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Rafael BISTRITZER, Vadim Vereschagin, Elad Sommer +5 more | 2023-06-27 |