Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347734 | Examination of a hole formed in a semiconductor specimen | Rafael BISTRITZER, Grigory Klebanov, Roman Kris, Ilan BEN-HARUSH, Omer Kerem +2 more | 2025-07-01 |
| 11756188 | Determining a critical dimension variation of a pattern | Roman Kris, Ishai Schwarzband, Boaz Cohen, Evgeny Bal, Ariel Shkalim | 2023-09-12 |
| 11686571 | Local shape deviation in a semiconductor specimen | Roman Kris, Ilan BEN-HARUSH, Rafael BISTRITZER, Elad Sommer, Grigory Klebanov +5 more | 2023-06-27 |
| 11651509 | Method, system and computer program product for 3D-NAND CDSEM metrology | Roman Kris, Roi Meir, Sahar LEVIN, Ishai Schwarzband, Grigory Klebanov +6 more | 2023-05-16 |
| 11476081 | Evaluating an intermediate product related to a three-dimensional NAND memory unit | Roman Kris, Assaf Shamir, Elad Sommer, Sharon Duvdevani-Bar, Meng Li Cecilia Lim | 2022-10-18 |
| 11315230 | System, method and computer program product for analyzing jpeg images for forensic and other purposes | Ron Atzmon, Sergey Markin, Yael Moscovitz | 2022-04-26 |
| 11276160 | Determining a critical dimension variation of a pattern | Roman Kris, Ishai Schwarzband, Boaz Cohen, Ariel Shkalim, Evgeny Bal | 2022-03-15 |
| 10810722 | System, method and computer program product for analyzing JPEG images for forensic and other purposes | Ron Atzmon, Sergey Markin, Yael Moscovitz | 2020-10-20 |