Patents per Year
Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12400314 | Mask inspection for semiconductor specimen fabrication | Ariel Shkalim | 2025-08-26 | |
| 11983867 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Ronen Madmon, Ori Petel, Alexander Chereshnya +2 more | 2024-05-14 | $61,768,000 |
| 11756188 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Boaz Cohen, Ariel Shkalim | 2023-09-12 | $47,983,000 |
| 11348224 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Ronen Madmon, Ori Petel, Alexander Chereshnya +2 more | 2022-05-31 | $62,587,000 |
| 11276160 | Determining a critical dimension variation of a pattern | Vadim Vereschagin, Roman Kris, Ishai Schwarzband, Boaz Cohen, Ariel Shkalim | 2022-03-15 | $44,583,000 |