Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11449979 | Measuring a pattern | Angela Kravtsov, Shimon Halevi, Utkarsh Rawat | 2022-09-20 |
| 11054753 | Overlay monitoring | Shay Attal, Lavi Jacov Shachar, Kevin Ryan HOUCHENS | 2021-07-06 |
| 10340116 | Imaging an area that includes an upper surface and a hole | Ran Schleyen, Shachar Paz | 2019-07-02 |